Electronic Design

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Articles in February, 2005 issue of Electronic Design

• Host of new options expands high-speed connector line.(Packaging & Interconnects)
• XML basics for embedded apps: the extended markup language (XML) consists of just a bunch of tags.(Language Series)
  by Wong, William
• Real-time spectrum analyzer handles 36-MHz bandwidth.(Test)
  by Novellino, John
• LM5000 supports isolated, higher-voltage boost applications.(Product Q&As)(Advertisement)
• You were the star at CES even if you didn't get to go.(Editorial)(Editorial)
  by David, Mark
• 40.680-MHz FSK RF transmitter uses two CMOS inverters.(Analog & Power)
  by Chevalerias, Olivier; Rodes, Francis; Garnier, Eliane
• Test suites for 802.11 wireless LAN conformance go automatic.(Test & Measurement)
• Where is serial RapidIO?(Embedded)
  by Wong, William
• Class D chips shrink footprint, power, and noise.(Analog & Power)
• How much do you know about SystemC?(What's happening @ elecdesign.com: keeping the EE community connected)
• Fully autonomous IEEE 802.3af Power over Ethernet midspan PSE requires no microcontroller--design note 350.(Design Notes)(Advertisement)
  by Reyes, Dillian
• CAN MCU tinier than ever.(Embedded News)
  by Wong, William
• PFC takes the stress out of power applications.
  by Davis, Sam
• Frequently asked questions: boost converter ICs step up to the plate.(Power Design FAQs)
  by Davis, Sam
• What's up?(What's happening @ elecdesign.com)
• New radiation-hardened, logic-level MOSFETs replace bipolar transistors and improve efficiency.(Product Alert)
• LabView manages real-time control design and simulation.(Test & Measurement)
• Concerned about support for axis hardware-based verification systems?(EDA Roundup)
• Hiring boom is on for security-cleared engineers.(TechView)
  by Schneiderman, Ron
• Solderable center-probe socket eases universal package debug.(Packaging & Interconnects)
• Module made for .Net embedded CLR development.(News )
  by Wong, William
• "Black box" platform relieves Bluetooth design woes.(Wireless)
  by Frenzel, Louis E.
• Budget-conscious flash FPGAs meet volume demands.(Digital)
  by Bursky, Dave
• The trouble with debuggers.(POV: point of view)
  by Haller, Craig A.
• Portable anemometer measures temperature, air velocity.(Test & Measurement)
• Latest scopes look to satisfy engineer wish lists: making the designer's job simpler is the driving force behind many DSO "dream" features.(Technology report: scopes)
  by Labs, Wayne
• Home-networking scheme takes advantage of existing installed coax.(Communications)
  by Frenzel, Louis E.
• Polling.(What's happening @ elecdesign.com: keeping the EE community connected)
• Clear-cover fuse blocks suit automotive, marine applications.(Packaging & Interconnects)
• PC/104 plus performs a wireless act.(News)
  by Wong, William
• Analyzers offer advanced Sonet/SDH Jitter testing.(Test)
  by Allan, Roger
• High-def interface streamlines HDTV video processor.(Digital)
  by Bursky, Dave
• What's all this comparator stuff, anyhow?(Pease Porridge)
  by Pease, Bob
• Adjustable-threshold cable tester suits low-cost resistance tests.(Test & Measurement)
• You got game: tap into the design secrets of gaming systems.(Engineering feature: the gaming frontier)(Cover Story)
  by Bursky, Dave
• New clock ICs provide clean clock generation and distribution with sub-picosecond jitter performance.(Product Q & As)(Advertisement)
• "Sound off".(What's happening @ elecdesign.com: keeping the EE community connected)
• Resistors/potentiometers/capacitors.(Component Specifier)
• Media Gateway Module integrates VolP apps.(Embedded News)
  by Wong, William
• Get back to basics!
• LM2731 and LM2733 boost regulators support portable applications.(Product Q&As)(Advertisement)
• What's cool.(What's happening @ elecdesign.com)
• PMBus wins friends.(Analog & Power)
  by Tuite, Don
• Ethernet DAQ board positioned for the benchtop.(Test & Measurement)
• Fast-Spice simulator zeroes in on transients.(EDA)
• Speaker amps generate high drive voltages from 3-V supplies.(Analog & Power)
  by Tuite, Don
• Modular connector enclosures veer toward commercial vehicles.(Packaging & Interconnects)
• 2U ATCA development chassis targets prototyping.(News)
  by Wong, William
• Class D amplifiers challenge "golden ears": audiophiles will find that delta-sigma modulation with closed-loop feedback makes a difference.(Putting New Technology In Perspective)
  by Tuite, Don
• Low-power CPU drives next-generation portable video.(Digital)
  by Bursky, Dave
• Conference sheds light on "takeback" laws.(The industry: conference preview)
  by Novellino, John
• Reconfigurable analyzer makes dual-, single-channel sampling a snap.(Test & Measurement)
• Optimize timing margins for your high-speed interface.(Design view: digital)
  by Srinivasagam, Kannan; Mahashin, David
• SFP MSA coax transceiver cuts costs in Sonet/SDH systems.(Communications)
• EiED online: Bus and Board Show: take 2.(What's happening @ elecdesign.com: keeping the EE community connected)
• Use excel to develop a traceability matrix.(Innovative Designs from Readers)
  by Kagan, Aubrey
• XML: flexibility where it counts: XML (eXtended Markup Language) is the hottest thing since HTML. In embedded applications, flexibility is more important than efficiency.(Special Editorial Feature)
  by Wong, William
• Enhanced parasitic extraction.(EDA Roundup)
  by Malianiak, David
• ADC'S conversion chains tag-team to boost throughput.(TechView: analog & power)
  by Tuite, Don
• Polling.(What's happening @ elecdesign.com)
• Free 2005 National Instruments catalog.(Catalogue Literature Review)
• Software tool suite powers WiMAX signal generation and analysis.(Test & Measurement)
• Analyzing both package and PC board.(EDA Roundup)
• IP vendors can ease the pain of IP reuse.(POV: Point Of View)
  by Kaskowitz, Mike
• Ultra-high-density interconnects tackle 15-GHz applications.(Packaging & Interconnects)
• USB 2.0 adapter handles high-current devices.(News)
  by Wong, William
• DSOs reveal serial I/O secrets: new probes and software simplify standards compliance.(Putting New Technology In Perspective)
  by Tuite, Don
• Design out soft-error susceptibility.(EDA)(Brief Article)(Product/Service Evaluation)
  by Maliniak, David
• LED market shines as LEDs replace light bulbs.(The industry: conference preview)(Brief Article)
  by Rebello, Jagdish
• Gaze into our crystal ball.(What's happening @ elecdesign.com)
• Universal amplifiers: high performance analog solutions from Linear Technology: outstanding AC performance with extremely low power.(Advertisement)
• LPT port drives programmable slewing-voltage control.(Innovative Designs from Readers)
  by Jayapandian, J.
• SOI drops the capacitor, doubles embedded DRAM capacity.(Digital)
  by Bursky, Dave
• What's up?(What's happening @ elecdesign.com: keeping the EE community connected)
• Low-friction rubber cable jacket stands up to tough conditions.(Packaging & Interconnects)
• Just one microcontroller pin sets programmable timer's interval.(Innovative Designs from Readers)
  by Jimenez, Ricardo; Moreno, Virgilia; Maciel, Mario
• Power integrity comes home to roost at 90 nm: IC designers moving to 90-nm processes can place power integrity atop their list of most worrisome design issues.(Technology report: power integrity)
  by Maliniak, David
• Validation of OCP-IP cores.(EDA Roundup)
  by Malianiak, David
• Converter process marries 5-V CMOS, high-voltage bipolar.(TechView: analog & power)
  by Tuite, Don
• EiED online.(What's happening @ elecdesign.com)

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