Beyond-CMOS Metrology Continues Development.(Editorial)
Semiconductor International, June, 2006 by Braun, Alexander E.
Alexander E. Braun, Senior Editor
A major problem with just about any nano device that is currently being considered as a possible replacement of regular semiconductors is its contacts. It is clear that to research materials and architecture realms beyond CMOS, metrology techniques that allow the engineer to observe and record the interaction between the contact and molecule (of whatever material is being investigated) are crucial if the requirements for increasingly higher-performance devices are going to continue being met. It also becomes necessary to do analytical characterization within the device of interest itself. For example, in the area of molecular electronics, performing any kind of spectroscopy on a self-assembled monolayer without considering...
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