Coping With New Metrology Requirements During Difficult Times.

Semiconductor International, May, 2009

Staff

This month's podcast interview features Linda Rae, executive vice president and COO at Keithley Instruments Inc. She speaks about the challenges faced by metrology as features become smaller and denser, and new materials and processes are introduced. "R&D is something that no company can afford to set aside," Rae said, "especially during times such as these."