EE-Evaluation Engineering

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Articles in Feb, 2007 issue of EE-Evaluation Engineering

• I can live with the beeps
  by Paul Milo
• Multifunction modules and chassis increase bandwidth
• Controller performs JTAG and emulation testing
• Single-Output power supply offers GPIB interface
• CW power meters handle multiple sensors
• Solution addresses design predictability crisis
• Portable Spectrum Analyzers deliver fast sweep speeds
• Dual-channel scope has 1-GS/s sampling rate
• Safety tester features built-in scanner
• Testing challenges of a multicore microprocessor
  by Louis Bushard
• Big can be beautiful
  by Mark Minot
• 6 1/2 digits is quite a handful
  by Tom Lecklider
• Improving throughput and accuracy with membrane probes
  by Bruce Virell
• WiMAX in the last several miles
  by Tom Lecklider
• PC-Based test Buyers Guide
• Tracking pedestrians with machine vision
  by Matt Slaughter
• TPC and DFS as cognitive radio techniques
  by David Case
• Array Test Option
• Programmable DC Load
• Wide-range Network Analyzer
• CDMA Power Amplifier
• Production boundary scan interface
• Simultaneous sampling cards
• Multiple-Output PCI Card
• JTAG Technologies/SPEA system combines ICT and boundary scan
• Teseq is new name of Schaffner test systems
• Autotestcon
• FormFactor joins STC
• Virginia engineer wins Readers' Choice prize
• Sypris Test & Measurement adds RF-related capabilities
• New Handbook focuses on LXI standard and technology
• Pressure strain and force
• Electrostatic discharge Gun
• Data acquisition
• Test and measurement
• Discrete Semiconductor testers
• EMI/RFI shielding
• Power subsystems
• Engineering services
• RF test enclosures and Shielding Tents
• Measurement and automation
• Microwave absorbers
• EMI shielding products
• Asian and European EMC test services