EE-Evaluation Engineering

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Articles in March, 2008 issue of EE-Evaluation Engineering

• Will there be a winner?
  by Paul Milo
• Software tools automate SATA Gen-2 testing
• Test solution addresses MIPI D-PHY interconnects
• DDS-based generator produces 20-MHz waveforms
• 1,000-V isolation creates 48 separate instruments
• Real-time scopes acquire one billion-plus samples
• Small-footprint meter powered solely from USB cable
• Mid-range Spectrum Analyzers show live RF signals
• There's more to data acquisition than A/D
  by Bob Judd
• Calculating accuracy of peak power measurements
  by Richard Theiss
• Ensuring that products will work
  by Tom Lecklider
• Taking control of the integration factor
  by Mahendra Muli
• Managing the cellular handset certification bottleneck
  by Phil Medd
• Minute components challenge AOI
  by Tom Lecklider
• Instrumentation Buyers Guide
• The case for early testing
  by Tom Lecklider
• Safety Shield coating
• Interlocking floor tiles
• Impedance amplifier
• Moldable plastic shielding
• Filter Arrays
• Wrist Straps
• Omnidirectional antenna
• ESD-safe bins
• Magnetic field calculation software
• Miniature test chambers
• Harmonics/flicker tester
• Random EFT burst generator
• High power amplifier
• ESD packaging
• Event Detector
• Double-stage filters
• Storage Cabinets
• Garments
• Adjustable Handlers
• Round flexible shields
• Shielded USB connectors
• Differential-pair ISN
• Ionizing air gun
• Universal wireless transceiver
• Horn Antenna
• Mil-461f test solutions
• LXI Standard
• Antenna Kit
• Electronic Loads
• Vibration screening systems
• Test and measurement
• Mobile and lab-based EMC testing.
• EMC accessories and instruments
• Adhesives and epoxies
• Portable test instruments