EE-Evaluation Engineering

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Articles in March, 2009 issue of EE-Evaluation Engineering

• Embedded tool optimizes remote test and programming
• LXI Carrier supports four function cards
• 800-W model added to low-profile load series
• Probe Cards target 300-mm DRAM wafer testing
• LCR Meter combines accuracy and high measurement rates
• PCI Express digitizer cards provide 256-MB signal memory
• Upgradeable-bandwidth scopes have 5-Gb/s pattern triggering
• Strengthen the strong
  by Paul Milo
• VNAs deliver frequency coverage to 70 GHz
• Instrumentation Buyers Guide
• Company guide
• With Digitizers, the little bits count
  by Tom Lecklider
• Phase coherent signal testing
  by Justin Stallings
• Optimize HALT results with best practices
  by Ted Kalal
• Making test lean again
  by John VanNewkirk
• AOI-AXI duo improves product yield
  by David Upton
• Seam aperture leakage in aerospace enclosures
  by Ron Brewer