EE-Evaluation Engineering

View more issues:

Articles in April, 2008 issue of EE-Evaluation Engineering

• Things to come?
  by Paul Milo
• Multiple communications ports distinguish PXI controllers
• Prewritten routines streamline wireless test
• Flexibility differentiates new SMU and switch modules
• PIM test system makes on-site measurements
• Probe cards measure DC and RF
• DMM redefines 6 1/2-digit resolution
• 10 DSOs and MSOs have fastest update rate
• Customizable card streams to PC
• Communicating with your boss is important
  by Judy Bokorney
• Small instruments with big performance
  by Tom Lecklider
• The triple convergence in instrumentation
  by Paul Schreier
• It's the network
  by Bob Rennard
• Programming preliminaries
  by Paul G. Schreier
• Class C can be quick and easy
  by Bill Yonkers
• Expanding the use of synthetic instruments
  by Peter Hansen
• LEGO® moves up-market
  by Tom Lecklider
• Improving yield with retooling and robust infrastructure
  by Yervant Zorian
• Adopting a lean approach
  by Richard Strouse
• The continuing evolution of MIL-STD-461: Version F
  by Steven G. Ferguson
• ATE pin electronics
• SOIC Sockets
• Vibration Test System
• Vibration Controller/analyzer
• Microwave signal generator
• DC Power Supply
• Palm-size logic analyzers
• Synchro/resolver card
• Solid-state switching matrix
• High-bandwidth Controller
• EMC accessories and instruments
• High-power amplifier
• Portable test instruments
• Antenna Kit
• Shielding Products
• Low-cost Vibration Test Systems and Digital Controllers
• Memory Recorders
• EMC solutions
• Data acquisition
• OFDM/A, MIMO, WLAN and WiMAX
• Test equipment auctions
• Shielding catalog and design guide
• Discrete Semiconductor Testers
• CompactPCI/PXI solutions