EE-Evaluation Engineering

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Articles in July, 2009 issue of EE-Evaluation Engineering

• Stories worth reading
  by Paul Milo
• Data-capturing application requires no programming
• Module-software combo delivers inclusive reports
• Triggering enhancements boost spectrum analyzers
• Sockets feature adjustable pads for fragile devices
• AC sources can simulate power line disturbances
• Generators provide signals from 100 kHz to 50 GHz
• Multifunction DAQ devices sample up to 2 MS/s
• Look to the sky when synchronizing systems
  by Paul G. Schreier
• Resolving test challenges for high-speed interfaces
  by Paul F. Scrivens
• IEEE 1149.7 expands JTAG functionality
  by Stephen Lau
• Product guide
• Company Guide
• EMC symposium rides into Central Texas
• Portable analyzers handle precise signal investigations
• High-speed digitizers offer 4 Gsamples of memory
• Low-cost scopes extend test equipment budgets
  by Tom Lecklider
• Multifunction DAQ modules integrate and diversify
  by Tom Lecklider
• Full-channel logic analysis highlight of DDR test suite
• Front end syncs data, GPS, and video inputs
• New technology improves analog voltage readings