IC makers push boundary scan. (integrated circuit manufacturers) (includes related articles on setting standards de facto and on the video conference on the Joint Test Action Group proposal)

EDN, October, 1988 by Harbert, Tammi

IC makers push boundary scan Although a standard testability scheme for ICs has yet to be approved, several IC companies plan to introduce standard parts that incorporate the Joint Test Action Group (JTAG) boundary-scan test method. Having such chips on the market will make it easier for engineers to design testability into their boards and systems, say industry spokesmen.

Both Texas Instruments (Dallas, TX) and AT&T Microelectronics (Berkeley Heights, NJ) plan to introduce standard products with the JTAG interface in 1989. AT&T already provides JTAG cells in its ASIC library. In addition, National Semiconductor (Santa Clara, CA) plans to offer JTAG ASIC cells first, then introduce standard JTAG products. The increasing use of surface-mount...

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