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Industry: Email Alert RSS FeedASTE and NEPCON present scholarships. (News Briefs).(American Society of Test Engineers)(Brief Article)
Test & Measurement World, April, 2003
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The American Society of Test Engineers (ASTE), in conjunction with the NEPCON family of exhibitions, has awarded $2500 scholarships to two PhD candidates in the Department of Electrical & Computer Engineering at Northeastern University. Young Jun Lee and Luco Schiano were presented their awards on January 31 at the Northeastern University Faculty Club in Boston, MA.
(NEPCON and T&MW have the same parent company.) ...
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