Test & Measurement World

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Articles in April, 2005 issue of Test & Measurement World

• T & MW celebrates test industry.(NEWSBRIEFS)(Test and Measurement gives award)
• Papers explain PCI Express basics.(BENCH-LEVEL TEST)(Brief Article)
• Intertek announces expansions.(NEWS)(Intertek Services Corp.)(Brief Article)
• EMC filter.(PRODUCTS)(Brief Article)
• Vector signal generator for 4G test.(PRODUCTUPDATE)(Brief Article)
• Flexible digitizer card.(PRODUCTUPDATE)(Brief Article)
• 3G video tester.(PRODUCTUPDATE)(Brief Article)
• Mobile data acquisition.(CATALOGS & PRODUCTS)(CEC Capital Equipment)(Brief Article)
• High-performance probes.(CATALOGS & PRODUCTS)(Probe Master Inc.)(Brief Article)
• LXI Consortium growth mushrooms.(STANDARDS)(LAN-based exensions for Instrumentation (LXI))
  by Reed, Greg
• Technology--a fad that's passed?(EDITOR'S NOTE)
  by Nelson, Rick
• CD catalog lists international standards.(NEWS)
• Why the surprise?(EDITOR'S NOTE)(Letter to the Editor)
  by Quinnell, Richard A.
• Combining talents: from design through field service, Axcera engineers cooperate to ensure the quality of the company's RF equipment.(ON THE ROAD)(Cover Story)
  by Nelson, Rick
• Sampling scope takes bandwidth lead.(EDITORS' CHOICE)(LeCroy Corp.)(Brief Article)
• Image acquisition and processing.(PRODUCTUPDATE)(Brief Article)
• Hardened test modules upgrade transmission development.(DATA ACQUISITION)
  by Webb, Stephen C.; Turbett, Marlin
• 3-D optical measuring system.(PRODUCTS)(ActiCM)(Brief Article)
• Tektronix debuts load-test system.(PRODUCTUPDATE)(Brief Article)
• DVT introduces vision software.(PRODUCTUPDATE)(Brief Article)
• Clock generator handles 2-GHz signals.(PRODUCTUPDATE)(Brief Article)
• Instrument catalog.(CATALOGS & PRODUCTS)(Brief Article)
• Rotordynamics measurements.(CATALOGS & PRODUCTS)(Brief Article)
• Calibration and data acquisition finally meet.(BENCH-LEVEL TEST)
  by Rowe, Martin
• Cellular or WiFi? A well-tested infrastructure conforming to the UMA standard lets your phone decide.(WIRELESS TEST)
  by Mlinarsky, Fanny; Systems, Azimuth; Sherlock, Ian
• Cadence delivers full-chip test technology.(NEWSBRIEFS)(Cadence Design Systems Inc.)(Brief Article)
• WEEE: no fun for manufacturers.(EUROPEAN REGULATIONS)
  by Quinnell, Richard A.
• Test sockets.(PRODUCTUPDATE)(Robson Technologies Inc.)(Brief Article)
• High-voltage digital I/O.(PRODUCTUPDATE)(Brief Article)
• Optical catalog.(CATALOGS & PRODUCTS)(Brief Article)
• Keep it safe: hipot testers help you find trouble spots and let you verify your product's electrical safety.(INSTRUMENTS)
  by Rowe, Martin
• Some days, you're the instrument ...(TESTVOICES)
  by Thompson, Brad
• Software generates AWG waveforms.(BENCH-LEVEL TEST)
• Calendar.(Calendar)
• Dueling standards?(EDITOR'S NOTE)
  by Reed, Greg
• Synthetic instrumentation: the time is now.(ATE SYSTEMS)(PXI and VXI modular architectures )
  by Caesar, Greg
• Automotive datalogger.(PRODUCTS)(Si-Gate)(Brief Article)
• MLF probing adapters.(PRODUCTUPDATE)(Brief Article)
• Multifunction calibrator.(PRODUCTUPDATE)(E Instruments Group LLC)(Brief Article)
• Base station analyzer.(PRODUCTS)(Brief Article)
• L-filter adapters.(PRODUCTS)(American Conec Corp.)(Brief Article)
• Powertrain test control system.(PRODUCTS)(Sakor Technologies Inc.)(Brief Article)
• Clamp meters.(PRODUCTUPDATE)(Brief Article)
• Measure jitter in a PLL.(COMMUNICATIONS TEST)(phase-locked loops )(Brief Article)
  by Rowe, Martin
• SAE offers historical standards.(NEWS)(Society of Automotive Engineers)(Brief Article)
• Test platform combines multiple strategies.(MANUFACTURING TEST)
• Changes underway to HBM device tests.(NEWS)(Human Body Model)(ESD Association)(Brief Article)
• PMD analyzer light sources.(PRODUCTUPDATE)(Brief Article)
• App notes cover measurements and switching.(BENCH-LEVEL TEST)(Brief Article)
• JTAG test system bundled with board tester.(MANUFACTURING TEST)(Brief Article)
• Rotary vibration system.(PRODUCTUPDATE)(GHI Systems Inc.)(Brief Article)
• Programmable switching systems.(CATALOGS & PRODUCTS)(Brief Article)
• Board test--time for a change?(An exclusive interview with a technical leader)(Interview)
• Teradyne unveils 3-D x-ray technology.(NEWSBRIEFS)
• Optical and x-ray inspection complement electrical test: APEX, February 22-24, Anaheim, CA, www.goapex.org.(SHOWHIGHLIGHTS)
• Missile system tested by LabView.(NEWS)(Brief Article)
• Data Matrix decoder software.(PRODUCTS)(Brief Article)
• Odyssey Xpro+ features 1.4-GHz PowerPC.(PRODUCTUPDATE)(Brief Article)
• PCI Express analyzer handles ASI.(PRODUCTUPDATE)(Advanced Switching Interconnect)(Brief Article)
• Digital light source.(PRODUCTUPDATE)(Brief Article)
• New EMC/EMI facility.(CATALOGS & PRODUCTS)(Brief Article)
• Infrared thermocouples.(CATALOGS & PRODUCTS)(Brief Article)
• When high-resistance measurements are too low.(BASIC MEASUREMENTS)
  by Cigoy, Dale
• Calendar.(Calendar)
• Agilent debuts per-pin floating licenses for 93000 Series.(NEWSBRIEFS)(Agilent Technologies Inc.)(Brief Article)
• Cameras augment vehicle safety.(NEWS)(Brief Article)
• Broadcast analyzer.(PRODUCTS)(Brief Article)
• RF parametric test option debuts.(PRODUCTUPDATE)(Brief Article)
• JTAG tester option.(PRODUCTUPDATE)(DiagnoSYS Systems Inc.)(Brief Article)
• Light measurement.(CATALOGS & PRODUCTS)(Brief Article)
• The best-laid boards.(MANUFACTURING TEST)(Printed circuit boards)
  by Scheiber, Steve
• Biological pulses.(ENVIRONMENTAL TEST)
  by Rowe, Martin
• Tracking down ESD.(ELECTROSTATIC DISCHARGE)
  by Quinnell, Richard A.
• Using digital scopes to analyze serial data buses.(INSTRUMENTS)
  by Nelson, Rick
• Choose memory depth and sample rate.(EDITORS' CHOICE)(Brief Article)
• Mixed-signal tester gets new features.(MANUFACTURING TEST)
• Calendar.(Calendar)
• FCC modifies UWB measurement procedures.(NEWS)(Federal Communications Commission)(Ultra-wideband)(Brief Article)
• Digital sensor interface.(PRODUCTUPDATE)(Vibrant Technology Inc.)(Brief Article)
• Frequency counter.(PRODUCTUPDATE)(B & K Precision)(Brief Article)