Test & Measurement World

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Articles in May, 2007 issue of Test & Measurement World

• PXI turns 10.(Mike Dewey, Mark Wetzel, Spencer Stock and Fred Bode of PXI Systems Alliance)(Interview)
  by Quinnell, Richard A.
• Highlights.
• News briefs.(Anritsu America Inc.'s range of microwave spectrum analyzers)(International Electrotechnical Commission issues standards for transceivers)(Universal Switching and Matrix Systems merger)
• Cycle and analyze DC power.
• Wire ends yield failure clues.
• The hub between stimulus and test.(Norton W. Alderson of Universal Switching Corp.)(Interview)
  by Maloney, Larry
• OFC technical sessions feature test and measurement.
• Oscilloscopes add logic channels.(product introduced by Tektronix )(Brief article)
• Compatibility is key to customer loyalty.
• Filters improve images.
• PXI DAQ cards.(Adlink Technology America introduces DAQ-2016 and PXI-2016 cards)(Brief article)
• PXI solid-state multiplexers.
• Taming power in PXI.(wireless communication systems)
  by Quinnell, Richard A.
• Five exabytes of distraction.(email, contacting methods)
  by Nelson, Rick
• USB frame grabber handles 60 fps.
• Probe-mark inspection.
• Time-to-market pressure drives parallel parametric test.(Parallel Test Technology: The New Paradigm for Parametric Testing, 1st ed.)(Book review)
  by Nelson, Rick
• Diodes and x-rays.
• Check the clock oscillators.
  by Rowe, Martin
• Test instrument revenue to approach $4.5b in 2010.(www.frost.com)(Brief article)
  by Nelson, Rick
• Vicor debuts high-density bus converter.
• Testing brings home telco TV.
• Parallel parametric test goes asynchronous.(Editorial)
  by Nelson, Rick
• Optics on silicon lose polarization dependence.
  by Rowe, Martin
• Agilent launches 3-D in-line AXI system.