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Test & Measurement World, May, 2007

Staff Keithley ACS enhances semiconductor characterization Staff Keithley Instruments aims to fill a gap in on-wafer semiconductor test between benchtop analyzers and production parametric test systems with its new Automated Characterization Suite, or ACS. The ACS works with the company's Model 4200 semiconductor characterization system as well as with its source/measurement instruments and pulse/pattern generators.

The Model 4200 itself (pictured) is now available with the new Model 4205-PG2 pulse-generator card, which offers a patent-pending 'Segment ARB' mode that lets users generate complex waveforms using simple line segments. New Model 4200-based applications support RF, power-FET, and flash test. The ACS is designed to address...

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