Manufacturing Industry
Analytical instruments yield data on sample surfaces. (Surface Engineering).
Advanced Materials & Processes, February, 2002
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Two advanced analytical instruments that are said to yield more analytical information on a wider variety of specimens have been developed by FEI Co., Hillsboro, Oregon. The Strata DB 235M DualBeam combines scanning electron and focused ion beam (FIB) technologies in a single, fully integrated platform to provide three-dimensional analysis and characterization of materials.
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The electron beam in a DualBeam system images a selected area, while the ion beam acts as microsurgical tool, allowing users to ...
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