Manufacturing Industry
Instrument enables study of morphology, stress, strain. (Materials Science/R&D).
Advanced Materials & Processes, December, 2002
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A technique that enables researchers to study the heterogeneous structure of materials in great detail and in three dimensions has been developed at Oak Ridge National Laboratory, Oak Ridge, Tenn. Called "differential-aperture X-ray microscopy," the technology will allow scientists to look at materials with dimensions between a tenth of a micron and hundreds of microns.
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In the new technique, a knife-edge profiler acts as a moving pinhole camera to make measurements with a charge-coupled device area detector. The approach builds on a device developed two years ago by Dr. ...
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