Atomic force microscope sees nanometer-size surface shapes. (Testing/Analysis).

Advanced Materials & Processes,  January, 2003  

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An atomic force microscope that is said to enable the visualization and measurement of nanometer-size surface structures has been developed by Pacific Nanotechnology Inc., Santa Clara, Calif. Called Nano-R AFM, the instrument includes SPM Cockpit software that offers both AFM image acquisition and image analysis capabilities.

The image capture software has an EZ Mode option for novice users and an X'Pert option for advanced users. It ...

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