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Nanocharacterization facility provides shared research. (Materials Science/R&D).
Advanced Materials & Processes, March, 2003
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An advanced Nanocharacterization Facility that will provide a set of research instruments to be shared by researchers from a variety of disciplines has been established at Stanford University, California, in collaboration with FEI Co., Hillsboro, Oregon. Stanford has purchased a Strata DB 235 small stage dual-beam FIB / SEM and will have access to FEI's XL30 Simon scanning electron microscope.
It will also be housed within the University's facility and will be used jointly for Flu customer demonstrations. The instruments allow advanced three-dimensional metrology, device editing, ...
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