Manufacturing Industry
AFM with sealed environment chamber views sample in vacuum. (Testing/Analysis).
Advanced Materials & Processes, June, 2003
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An atomic force microscope (ATM) system in which a hermetically sealed sample chamber is combined with modular environmental controls has reportedly been developed by Veeco Instruments, Santa Barbara, Calif. Called EnviroScope, the system provides atomic force microscopy scanning under non-ambient vacuum, gas, and liquid environments.
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The EnviroScope provides vacuum, gas, and liquid purge and exchange, as well as sample and environment heating and cooling. The instrument is based on the low-noise Dimension ATM head, and includes a ...
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