Manufacturing Industry
Enter the EDFAS Photo Contest. (ASM News).
Advanced Materials & Processes, June, 2003
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The third annual EDFAS Photo Contest is open to all members of the electronic device failure analysis community. Submissions are requested in Optical Microscopy (color), Optical Microscopy/SEMI TEM/X-Ray/UV Micrographs (black and white) and SPM/SAM/Photo Emission/Other (false color). Entries must be submitted by Aug.
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31 in Microsoft PowerPoint files. The slide should display the name of submitter, category of submission, mailing address, telephone and fax number, email address and a description of the micrograph (50 ...
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Most Popular Articles in Business
- Research and Markets : Tesco Plc - SWOT Framework Analysis
- Do Us a Flavor - Ben & Jerry's Issues a Call for Euphoric New Flavors
- eBay made easy: ready to start an eBay business? These 5 simple steps will ...
- Katrina's lawsuit surge: a legal battle to force insurers to pay for flood ...
- Wal-Mart's newest distribution center opened last month near the southwest ...
- More »