Enter the EDFAS Photo Contest. (ASM News).

The third annual EDFAS Photo Contest is open to all members of the electronic device failure analysis community. Submissions are requested in Optical Microscopy (color), Optical Microscopy/SEMI TEM/X-Ray/UV Micrographs (black and white) and SPM/SAM/Photo Emission/Other (false color). Entries must be submitted by Aug. 31 in Microsoft PowerPoint files. The slide should display the name of submitter, category of submission, mailing address, telephone and fax number, email address and a description of the micrograph (50 ...