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EDFAS photo contest submission deadline approaches. (ASM News).
Advanced Materials & Processes, July, 2003
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The Electronic Device Failure Analysis Society (EDFAS) is hosting its third annual photo contest, which is open to all members of the electronic device failure analysis community. Submissions are requested in Optical Microscopy (color), Optical Microscopy/SEM/TEM/X-Ray/UV Micrographs (black and white) and SPM/SAM/Photo Emission/ Other (false color).
Entries must be submitted by Aug. 31 in Microsoft PowerPoint files via to photocontest@edfas.org (with subject line of EDFAS photo contest). The slide should display the name of submitter, category of submission, mailing ...
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