Manufacturing Industry

AFM combines with imaging to study nanometer surfaces.(Testing/Analysis)

Advanced Materials & Processes, August, 2004

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A technology in which real-time detection of molecular interactions and single-molecule sensitivity are combined with the imaging capability of the atomic force microscope (AFM) has been announced by Molecular Imaging Corp., Tempe, Ariz. The system is called PicoTREC, a Topography and RECognition imaging system.

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According to the company, it is a powerful tool for the materials and polymer sciences, nanotechnology, or any field in which it is useful to study molecular interactions in real time. It can image and map binding sites or probe nanometer-scale areas on a variety of ...

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Manufacturing Industry

AFM combines with imaging to study nanometer surfaces.(Testing/Analysis)

Advanced Materials & Processes, August, 2004

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