Method developed to measure thin-film strength, stiffness.(Testing/Analysis)

Advanced Materials & Processes,  October, 2004  

Tags: NIST

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An inexpensive testing method for measuring the strength and stiffness of thin films has reportedly been developed by the National Institute of Standards and Technology (NIST), Gaithersburg, Md. The test takes two seconds, and accommodates high-throughput testing, enabling hundreds or even a few thousand samples to be tested in rapid succession.

The method involves mounting a postage-stamp-size assortment of incrementally varying thin films on a strip of silicone rubber about two inches long by an inch wide. The combination of sample array and soft substrate is then stretched or ...

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