Manufacturing Industry
Crystal Sensor enables SPM visualization of nanoscale.(OBSERVATIONS)
Advanced Materials & Processes, April, 2005
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Pacific Nanotechnology Inc. (PNI), Santa Clara, Calif., announces the Crystal Sensor, said to be the key to high-quality scanning probe microscopy (SPM). On the Crystal Sensor, the imaging probe is mounted on the tip of a resonating arm at the end of a small quartz cross crystal oscillator. While imaging, the vibration amplitudes are less than 0.3 nm, and the probe-to-surface forces are less than 0.3 nanonewton, ensuring excellent, sharp images.
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[ILLUSTRATION OMITTED] The sensor is used with the Crystal Scanner in both PNI's Nano-R and Nano-I scanning probe microscopes. The SPMs ...
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