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Digital microscopy system scans in nanometer increments.(TESTING/ANALYSIS)
Advanced Materials & Processes, October, 2005
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A fast-scanning, digital image analysis microscopy system that is able to autofocus from starting distances of over 35 cm (14 in.) controlled in nanometer increments has reportedly been developed by Jmar Technologies, South Burlington, Vt. Called VersaCam, the instrument allows deconvolved imagery of samples.
Its design provides an unobstructed viewing area to encompass large samples, and the microscope can be rotated to view large adjacent static samples of any size. This flexible geometry, combined with the ability to rotate the objective lens 360 degrees, enables high ...
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