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X-ray microscope examines nanomaterials in three dimensions.(TESTING CHARACTERIZATION)

Advanced Materials & Processes,  February, 2007  

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A new X-ray microscope that can look at nanomaterials in three dimensions has reportedly been developed by researchers at the University of California at Davis and at Los Angeles. The device could help to design better materials for electronics, optics, and biotechnology. The technology involves shining a powerful X-ray source onto a nanoparticle and collecting the X-rays scattered from the sample.

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Then computers construct a three-dimensional image from that data. The microscope can resolve ...

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