Manufacturing Industry
Phase contrast enables X-rays to reveal nanometer features.(TESTING CHARACTERIZATION)
Advanced Materials & Processes, February, 2007
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A phenomenon known as phase contrast has been exploited to observes molecular-scale features less than a nanometer in height by researchers at Argonne National Laboratory together with Xradia, Concord, Calif. By combining X-ray reflection with high-resolution X-ray microscopy, scientists can now study interactions at the nanometer scale, where materials often exhibit different properties.
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This novel technique will lead to a better understanding of interfacial reactions at surfaces, such as ion adsorption, ...
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