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Atom-scale Images Will Help Materials Researchers Develop Strong, Heat Resistant Advanced Ceramics.
Advanced Materials & Composites News, April, 2004
Tags: atom, Oak Ridge National Laboratory, silicon
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April 15, 2004 - In the April 15, 2004, issue of Nature, Oak Ridge National Laboratory (ORNL) reports on high resolution (0.7 angstrom) images from a Z-contrast scanning transmission electron microscope (STEM). The world-record 0.7 angstrom resolution reveals the preferred location of atoms within a silicon nitride ceramic, matching theoretical calculations.
Location of specific atoms is key to the properties of the material. Developers expect these images to allow computer modeling of materials, avoiding costly time consuming fabrication and characterization of samples. ...
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