Non-contact measurement system.(New Products)

Fiberoptic Product News, November, 2003

Micro-Meric, Inc. San Jose, CA www.micro-meric.com.

The automated MicroLine 600 non-contact measurement system from Micro-Metric, Inc. is now available with Windows 2000 capability. The system provides both depth and linewidth measurement for semiconductor wafers. MicroLine 600 measures linewidths of 0.5-40 mm at 100x, and 10-800 mm at 5x. Application programs included with the MicroLine 600 are written using the company's powerful Measurement Control Language. This text-based language controls all functions of the MicroLine 600. Program files are easy to read and allow users to modify existing programs or create their own programs to control the system's operation.

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