Manufacturing Industry
Elemental analysis.
Advanced Ceramics Report, October, 1999
An ion microprobe that can recognize every element in a sample has been developed under a collaborative project in France.
The Office National d'Etudes et de Recherches Aerospatiales (ONERA), the University of Paris-Sud (UPS) and a privately owned company, Cameca, worked together to produce the Nanosims 50.
Such a device works by bombarding samples with an ion beam. The beam pulverizes the matter and some of the ejected atoms are ionized. These ions are then guided by electric fields and transmitted to a mass spectrometer that sorts them. Imaging can be obtained by moving the ion probe across the surface of the sample.
However, several problems had to be overcome in designing a probe based on this principle. For instance, the primary-ion...
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