Manufacturing Industry

Under the US Department of Energy Office of Basic Energy Sciences' TEAM project, FEI and five national labs will build a microscope system based on aberration corrected electron microscopy

Instrument Business Outlook, Jan 31, 2005

Under the US Department of Energy Office of Basic Energy Sciences' TEAM (Transmission Electron Aberration-Corrected Microscope) project, FEI and five national labs will build a microscope system based on aberration corrected electron microscopy for direct observation and analysis of individual nanostructures at a resolution of 0.5 Angstron.

COPYRIGHT 2005 Strategic Directions International Inc. (SDI)
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