Agilent Technologies to Show New Test Solutions for Microwave, RF, Wireless and Radar at 2008 European Microwave Conference

Business Wire, Oct 27, 2008

AMSTERDAM, The Netherlands -- Agilent Technologies Inc. (NYSE:A) today announced it will demonstrate its newest test and measurement solutions for microwave, RF, wireless and radar here at the 2008 European Microwave Conference, in Hall 3, stand 703. Featuring industry-leading performance and functionality, Agilent's test solutions enable R&D and manufacturing engineers, maintenance and service providers to develop and deliver innovative products for current and future requirements in this competitive market.

"Agilent delivers inventive test products and applications that allow engineers to speed-up their development and delivery to the demands in microwave, RF, wireless and radar applications," said Ron Nersesian, vice president of Agilent's Wireless Business Unit. "Our newest measurement solutions reinforce our commitment to empower engineers to stay at the forefront of these rapidly evolving technologies."

Agilent will showcase 21 demonstrations, among them are the following:

For R&D and Manufacturing Engineers

* Electronic system-level (ESL) design with Agilent's SystemVue 2008, a new electronic design automation (EDA) platform: It cuts physical layer (PHY) design time in half for high-performance communications algorithms and system architectures, for both wireless and aerospace/defense applications. It is ideally suited to system architects of high-performance PHYs; to algorithm developers for emerging wireless PHYs, such as 3GPP LTE; and to aerospace/defense applications, such as software-defined radio (SDR), satellite communications and radar. See www.agilent.com/find/eesof-systemvue.

* Electromagnetic design with Agilent's new EM Professional (EMPro) 3D EM design platform: EMPro has the most modern user interface available, along with high simulation capacity and integration with Agilent's Advanced Design System for fast and efficient system and circuit design.

* Analysis and design of active components with the Agilent Nonlinear Vector Network Analyzer (NVNA): Based on the Agilent PNA-X it provides industry-leading performance, accuracy, and configurability to simplify test setups and give detailed insight into designing nonlinear components including new nonlinear scattering parameters called X-parameters, and nonlinear pulse envelope domain capabilities. The NVNA capabilities can be linked with the Agilent ADS simulation environment to deliver a fast, accurate and powerful approach for the design of active devices. More information is available at www.agilent.com/find/nvna or www.agilent.com/find/pna-x.

* MIMO channel emulation and co-existence test with the Agilent N5106A PXB MIMO receiver tester: The Agilent PXB MIMO receiver tester transforms complex channel emulation up to 4x2 MIMO into a calibrated and repeatable test process for R&D engineers developing BTS or mobile receivers. The Agilent PXB supports all the major wireless standards, including WiMAX[TM] and LTE. Its capabilities make the new PXB ideal for R&D engineers developing and integrating MIMO receivers for 3GPP LTE, WiMAX and emerging wireless standards. More information is available at www.agilent.com/find/pxb.

* MIMO- LTE signal analysis: Agilent is keeping its commitment to support LTE evolution with its industry-leading signal analysis solutions. Agilent's advanced 89600 Series Vector Signal Analysis software and high performance mid-range MXA signal analyzers will be featured, demonstrating new low cost yet high performance 2x2 MIMO LTE signal analysis. More information is available at www.agilent.com/find/LTE.

* Microwave network analysis with the new industry-standard, PNA-X network analyzer: This analyzer offers a unique single-connection solution for CW and pulsed S-parameter, compression, IMD, and noise figure measurements.

* Differential mm-wave measurements up to .5 THz - from the first solution able to make 4-port true differential measurements up to 0.5 THz: The PNA-X is transformed into a differential millimeter component measurement system with Agilent's new mm-wave test set controllers. More information is available at www.agilent.com/find/mmwave.

* Antenna test with the industry's fastest measurement receiver, the Agilent PNA-X measurement receiver: It provides a 30-percent faster data-acquisition speed than any other antenna receiver on the market (400,000 data points per second simultaneously on each of the five receiver channels). Offering an optional Fast-CW mode enables a 500 million point data buffer that allows users to stream infinite amounts of data directly to the network. More information is available at www.agilent.com/find/N5264A.

* Semiconductor test and characterization using the powerful Agilent 5400 Atomic Force Microscope (AFM) with SMM Mode: This solution combines the comprehensive electrical measurement capabilities of the Agilent performance network analyzer with the outstanding spatial resolution of the 5400 AFM gives very accurate scanning capacitance measurement at nanoscale. In SMM Mode, it is capable of scanning areas up to 90m x 90m, and works on all semiconductors, including Si, Ge, III-V and II-VI.