FormFactor, Agilent Team Up for Flash Wafer Test System

Electronic News, July 23, 2001

FORM FACTOR INC. AND AGILENT TECHNOLOGIES INC. HAVE jointly developed a quarter-wafer flash memory test system that increases throughput as much as 50 percent, the companies said. The system can accurately test an entire 200mm wafer in just four wafer probe touchdowns, according to Livermore, Calif.-based FormFactor and Palo Alto, Calif.-based Agilent (nyse: A).

Initially produced for flash memory maker Falsh Vision LLC, a joint venture between Toshiba Corp. and SanDisk Corp., the system features FormFactor's WaferProbe PH100 probe card with its Microspring contact technology and Agilent's Versatest Model V4400 tester. Planarity across the active probing area is reproducible within a few microns. With more than 2,304 I/O channels and a total of more than 7,300 contacts in FormFactor's 14-inch probe card, the system has the industry's highest density wafer sort interface, the companies said.