Keithley Instruments Adds Probers and Features to Wafer Analyzer Software

Electronic News, August 27, 2001

KEITHLEY INSTRUMENTS INC. has upgraded its 4200-SCS Semiconductor Characterization System parameter analyzer software, which now supports additional probers and adds high-frequency and quasi-static test capabilities for C-V meters, according to the Cleveland-based company (nyse: KEI). The software, KTE Interactive v4.2, includes features that are part of the Keithley Interactive Test Environment (KITE) module, a point-and-click interface that allows users to create comprehensive wafer test sequences without programming, Keithley said.

New KITE features include more data plotting functions, the ability to append multiple data runs to a given test and plot those data on the same graph, the addition of test condition information to a graph, and easier analysis with new cursor functions. All test data sheets can be saved in comma-delimited ASCII format in addition to spreadsheet format. The KTE Interactive v4.2 upgrade is available for $1,495; existing users of the Model 4200-SCS may order a free upgrade.