Cray to use Corelis, JTAG software

Electronic News, Oct 10, 1994

WASHINGTON--Cray Research will use the Scantest line of automated boundary scan test pattern generation software and diagnostics marketed by Corelis, Inc., and JTAG Technologies BV as the embedded software for built-in test and diagnostics of its next generation of supercomputing systems.

Cray Research will employ Scantest to generate boundary scan test vectors directly from its own electronic design database. The test vectors will be executed by a Cray core processor to serve as an indepth, power-up self-test or to provide error diagnostics in the field, according to Corelis and JTAG Technologies.

At the International Test Conference here, Corelis also reported that Intel's Supercomputer Systems Division is using Corelis' boundary scan products for built-in test and diagnostics of the Paragon supercomputer system. The OEM relationship between Corelis and Intel is two years old, and Corelis has shipped 400 boundary scan test systems to the Intel division in Beaverton, Ore.

The IEEE 1149.1 boundary scan standard includes a "scan bus" that can be used for rapidly moving data to and from many system components via a private connection that does not rely on system buses or networks under test, Corelis said. The Intel Paragon uses this both for diagnostics and systems boot-up.

"Intel is one of a growing number of companies that have selected our Scantest tools for system-level testing," said Menachem Blasberg, president of Corelis. "We are very pleased that our products were delivered on time and have met Intel's stringent requirements."

Corelis and JTAG Technologies also reported that Motorola has selected them to supply boundary scan test hardware and software for the Iridium satellite communications system project. Motorola will use VXI-based testers with the boundary scan software for the project.

"Due to the critical nature of the orbiting satellite system required to provide worldwide communications coverage, rigorous testing of hardware components and subassemblies is required at all stages of system integration and operation," said Mr. Blasberg. "Such a level of test can only be accomplished at a reasonable cost by fully utilizing the potential benefits of boundary scan technology. In this case, over 50 boundary-scan test chains will be tested using Corelis, Inc.'s VXI-based testers."

At ITC, Corelis and JTAG Technologies introduced a C-size VXIbus-based boundary scan controller that includes a 616-pin tester. The scan controller portion of the new CVXI-1149.1/616 is compatible with Corelis' CVXI-1149.1 boundary scan controller. It includes six test access ports (TAPs) for connection to a system under test and a scan function library (SFL) in compiled form and C source code. The U.S. list price for the CVXI-1149.1/616 is $9,950, and it is available from stock.

The companies have additionally upgraded their Scantest software with the combination of National Semiconductor's SCANPSC110 bridge IC, introduced a year ago, to enable users to implement a multidrop or hierarchical system test architecture. Pricing starts at $4,250, with availability from stock.

Lastly, Corelis and JTAG Technologies have ported Scantest--previously available only on the DOS operating system--to a variety of Unix platforms and to OS/2. Scantest is now available in resident versions for HP-UX. SunOS, Solaris, SCO-Unix and Apollo Computer Domain-based workstations.

Corelis is based in Cerritos, Calif., and has a cooperative relationship with JTAG Technologies to integrate and market boundary scan products. JTAG Technologies of Eindhoven, the Netherlands, is a spinoff from Fluke, originating within the former test and measurement operations of Philips.