Sun Microsystems - buys icBIST embedded technology from LogicVision - Company Business and Marketing

Electronic News, July 20, 1998 by Ann Steffora

Sun Microsystems recently purchased LogicVision's icBIST embedded ATE technology. LogicVision reported that Sun has made a corporate-wide purchase of icBIST in order to reduce at-speed test development time, engineering resources and test costs for high-performance products. By leveraging existing methods and tools in design, Sun is incorporating embedded ATE in their ASIC design cycle.

Once designed into the ASIC, embedded ATE delivers high fault coverage test at application speeds for the entire life of the ASIC. Sun can use the same embedded ATE to test the ASIC on the chip tester, board tester, during system test in the factory and at customers' sites, LogicVision said.