Bibliography for: "Measurement of polarization-mode dispersion - includes related articles on Jones calculus, the Poincare Sphere, and the HP 8509A/B Lightwave Polarization Analyzer - Technical"

Brian L. Heffner "Measurement of polarization-mode dispersion - includes related articles on Jones calculus, the Poincare Sphere, and the HP 8509A/B Lightwave Polarization Analyzer - Technical". Hewlett-Packard Journal. FindArticles.com. 19 Dec, 2009. http://findarticles.com/p/articles/mi_m0HPJ/is_n1_v46/ai_16645505/

Hewlett-Packard Journal

View more issues:

Articles in Feb, 1995 issue of Hewlett-Packard Journal

• Measurement of polarization-mode dispersion - includes related articles on Jones calculus, the Poincare Sphere, and the HP 8509A/B Lightwave Polarization Analyzer - Technical
  by Brian L. Heffner
• Automation of optical time-domain reflectometry measurements - HP 81700 Series 100 remote fiber test system - Technical
  by Frank A. Maier
• A framework for insight into the impact of interconnect on 0.35- VLSI performance - micrometer - Very-Large-Scale Integration - Technical
  by Prasad Raje
• Erbium-doped fiber amplifier test system - HP 81600 200 EDFA test system
  by Edgar Leckel
• High-power, low-internal-reflection, edge emitting light-emitting diodes - HP's 8504B precision relectometer - Technical
  by Dennis J. Derickson
• A new, flexible sequencer architecture for testing complex serial bit streams - implemented in HP 3070 board test systems - Technical
  by Robert E. McAuliffe
• Broadband frequency characterization of optical receivers using intensity noise - enhancing the dynamic range of the intensity noise technique for high-frequency photoreceiver calibration - includes related article on the fiber-optic amplifier - Tutorial
  by Douglas M. Baney
• Precision reflectometer with spurious-free enhanced sensitivity - HP 8504B precision reflectometer - Technical
  by David M. Braun
• Generating short-wavelength light using a vertical-cavity laser structure - Technical
  by Shigeru Nakagawa
• Better models or better algorithms? Techniques to improve fault diagnosis - includes related article on bridging and stuck-at faults - Technical
  by Robert C. Aitken
• Multi-quantum-well ridge waveguide lasers for tunable external-cavity sources
  by Tirumala R. Ranganath
• Jitter analysis of high-speed digital systems - HP 71501B jitter and eye diagram analyzer - Technical
  by Christopher M. Miller
• Shortening the time to volume production of high-performance standard cell ASICs - coding guidelines for behavioral modeling and a process for generating wire load models - Technical
  by Jay D. McDougal
• Design and performance of a narrowband VCO at 282 THz - voltage-controlled single-mode optical signal source - Technical
  by Peter R. Robrish
• A new design approach for a programmable optical attenuator - HP 8156A optical attenuator - Technical
  by Siegmar Schmidt
• Surface emitting laser for multimode data link applications - Technical
  by Michael R.T. Tan
• Synthesis of 100% delay fault testable combinational circuits by cube partitioning - proposed synthesis algorithm - Technical
  by William K. Lam