Fast turnaround of a structured custom IC design using advanced design tools and methodology

Hewlett-Packard Journal, April, 1997 by Rory L. Fisher, Stephen R. Herbener, John R. Morgan, John R. Pessetto

              Percent of      Number of
              Total FET     Standard Cell     Thousands of
Style           Count     Gate Equivalents    FETs per [mm.sup.2]

Data Path         60%        497,000                22.0

Standard          10%         53,000                10.8
Cell

RAM,              21%         (>48K bytes)          42.7
FIFO

Pads,              9%
Clock,
etc.

Some additional statistics for the IMACC project include: 2342 FETs/day, 8673 FETs/[mm.sup.2], and more than 550,000 standard cell equivalent gates.

Acknowledgments

We would like to thank Rich Nash for his time spent developing Dpc14 and for his timely responses to our suggestions.

(*) A kernel is a functional unit that can be repeated as needed. A 3 X 3 programmable function on a 3 X 3 array of pixels. A 4 X 4 bicubic convolution kernel performs a bicubic convolution on a 4 X 4 array of pixels.

Reference

[1.] S. Waser and M.J. Flynn, Introduction to Arithmetic for Digital Systems Designers, Holt, Rinehart, and Winston, 1982, pp. 132-137.

[2.] R. Nash and R. Martin, "Datapath Requirements for Structured Custom Design," Proceedings of the 1995 HP Design Technology Conference, pp. 411-418.

AUTHORS

6 Mixed-Signal Test Instruments

Robert A. Witte

An R&D section manager at HP's Electronic Measurements Division, Bob Witte is responsible for managing product development for test and measurement equipment. Previously he was the R&D project manager for the HP 54600 Series oscilloscopes and earlier worked as an R&D engineer in the HP oscilloscope lab. He also was an adjunct professor at Colorado Technical University, where he taught electrical engineering for several semesters. Before that, he was an R&D project manager at HP's Lake Stevens Instrument Division. He is named as an inventor in two patents, one on frequency-domain measurements and the other on HP 54645 acquisition techniques. He has authored two books, one on electronic test instruments and the other on spectrum and network measurements. He has also written numerous articles on electronic measurements and is a senior member of the IEEE. He is currently working towards a Management of Technology degree from the National Technological University. Bob received a BSEE degree in 1978 from Purdue University and an MSEE degree in 1980 from Colorado State University. He joined HP's Loveland Instrument Division in 1978. In his free time, He enjoys amateur radio (KBOCY) and outdoor activities in the Colorado mountains.

10 Testing a Mixed-Signal Design

Jerald B. Murphy

Jerry Murphy is the product manager for the HP 54600 Series waveform products. Before that he was the product manager for the HP 54120 family of microwave oscilloscopes and TDR products. He is professionally interested in developing marketing communication techniques for engineers using HP electronic instruments. He has written several articles and presented papers on topics ranging from TDR to oscilloscope measurements. Jerry was born in Tyler, Texas and received a BSEE degree from the University of Texas at Arlington in 1964. After graduating he worked in the aerospace industry before joining HP's Southern Sales Region at Richardson, Texas in 1969. He later joined the marketing group at HP's Colorado Springs Division. Jerry is married and he and his wife each have two grown children. They also have two grandchildren. One of Jerry's passions is free-flight aeromodeling. He is a member of a club devoted to this sport and also serves on the U.S. national rules committee for the Academy of Model Aeronautics. He is presently the holder of a U.S. national record for gas-powered free-flight models. He has flown competitively in Australia, Europe, Japan, and New Zealand and was the U.S. national champion in 1991. He also enjoys photography, hiking, and camping in the Colorado mountains and is active in the Boy Scouts.