Patient issued for reverse-angle X-ray diffraction - News Briefs - Brief Article

Journal of Research of the National Institute of Standards and Technology, Jan, 2002

Patent 6,269,144 was recently issued to NIST for a "Method and Apparatus for Diffraction Measurement Using a Scanning X-ray Source." The concept combines the high-energy X-ray diffraction technology that has been developed by NIST during the past 5 years with the unique area-scanned X-ray tube developed by a private company. The technique differs from conventional X-ray scanning systems in that the X-ray source is scanned through a pattern instead of the specimen. The technique is particularly appropriate for rapid determination of texture or identifying the phases present in a specimen.

CONTACT: Tom Siewert, (303) 497-3523; siewert@boulder.nist.gov