Bibliography for: "Statistical interpretation of key comparison reference value and degrees of equivalence"

R.N. Kacker "Statistical interpretation of key comparison reference value and degrees of equivalence". Journal of Research of the National Institute of Standards and Technology. FindArticles.com. 28 Dec, 2009. http://findarticles.com/p/articles/mi_m0IKZ/is_6_108/ai_n6090469/

Journal of Research of the National Institute of Standards and Technology

View more issues:

Articles in Nov-Dec, 2003 issue of Journal of Research of the National Institute of Standards and Technology

• NIST researchers develop new microwave mixer theory; Aid industrial development of calibration procedure
• Technique invented for measuring the residual stress in a structure
• Statistical interpretation of key comparison reference value and degrees of equivalence
  by R.N. Kacker
• NIST microfabricates atomic vapor cells for Chip-Scale Atomic Clocks
• Studies performed of acoustic loss in langasite, langatate, and langanite
• NIST hosts rocket propellant RP-1 workshop
• Evaluation of intrusion detection systems
  by Jacob W. Ulvila
• NIST validates 100th Advanced Encryption Standard implementation
• New microfluidic DNA analysis system for forensics applications demonstrated by NIST
• NIST hosts groundbreaking voting standards symposium
• The normalized reduced form and cell mathematical tools for lattice analysis—symmetry and similarity
  by Alan D. Mighell
• NIST provides key measurements for superconducting magnets for the International Thermonuclear Experimental Reactor
• NIST researchers use "frustrated" optical technique to measure formation of nanocoatings
• NIST launches economic tools for homeowner durability decisions
• Recommended Practice Guide on Data Evaluation Theory and Practice for Materials Properties developed
• Simulation of an Austenite-twinned-Martensite interface
  by A.J. Kearsley
• In situ stress measurements during electrodeposition of thin films studied
• High accuracy ultraviolet index of refraction measurements using a Fourier transform spectrometer
  by Rajeev Gupta
• One- and two-photon photoelectron spectroscopy used to study molecular electronics systems