Optical and Microstructural Characterization of the Effects of Rapid Thermal Annealing of CdTe Thin Films Grown on Si (100) Substrates

Journal of Electronic Materials, Jun 2005 by Neretina, S, Sochinskii, N V, Mascher, P

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S. NERETINA,1,3 N.V. SOCHINSKII,2 and P. MASCHER1

1.-Centre for Electrophotonic Materials and Devices (CEMD), Department of Engineering Physics, McMaster University, Hamilton, ON, Canada L8S 4L7. 2.-Institute de Microelectronica de Madrid-CNM-CSIC, c/Isaac Newton 8 (PTM), 28760 Très Cantos, Madrid, Spain. 3.-E-mail: neretis@mcmaster.ca

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