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Metrology assuming larger role with recovery - Special Section: Wafer Processing - semiconductor industry forecasts
Metrology assuming larger role with recovery. (Special Section: Wafer Processing).(semiconductor industry forecasts) The industry may have seen...
Electronic News, 07/22/02 by Jay Lindquist · More from publication -
In-Fab Structural Analysis Eases the 300mm Transition
In-Fab Structural Analysis Eases the 300mm Transition.(Industry Trend or Event) The technology shifts associated with designing and manufacturing...
Electronic News, 07/16/01 by Jay Lindquist · More from publication -
Do you have the right beam for the job? High-current-density electron and ion beams are opening many doors in nanoscale research as a result of the development of better beam sources.

By Jay Lindquist, Doug Rathkey, and Phil Fischer, FEI Co. Jay Lindquist is an applications scientist at FEI Co., Beaverton, OR. He received a PhD...
R & D, 06/01/90 by Fischer, Phil; Lindquist, Jay; Rathkey, Doug · More from publication


