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Capability Indices Can Deceive
While they are widely used to report process capability, process capability indices such as C^sub p^, C^sub pk^, P^sub p^, and P^sub pk^ are almost...
Manufacturing Engineering, 11/01/05 by Wachs, Allise; Wachs, Steven · More from publication -
Do You USE SPC CORRECTLY?
Misapplication of statistical process control can damage your operations If a product fails or a process performs inadequately, we attempt to...
Manufacturing Engineering, 03/01/05 by Wachs, Allise · More from publication



